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dc.contributor.authorJorayeva, Manzura
dc.contributor.authorAkbulut, Akhan
dc.contributor.authorCatal, Cagatay
dc.contributor.authorMishra, Alok
dc.date.accessioned2024-04-24T07:19:11Z
dc.date.available2024-04-24T07:19:11Z
dc.date.created2022-06-20T14:34:39Z
dc.date.issued2022
dc.identifier.citationSensors. 2022, 22 (13), 4734.en_US
dc.identifier.issn1424-8220
dc.identifier.urihttps://hdl.handle.net/11250/3127846
dc.description.abstractSmartphones have enabled the widespread use of mobile applications. However, there are unrecognized defects of mobile applications that can affect businesses due to a negative user experience. To avoid this, the defects of applications should be detected and removed before release. This study aims to develop a defect prediction model for mobile applications. We performed cross-project and within-project experiments and also used deep learning algorithms, such as convolutional neural networks (CNN) and long short term memory (LSTM) to develop a defect prediction model for Android-based applications. Based on our within-project experimental results, the CNN-based model provides the best performance for mobile application defect prediction with a 0.933 average area under ROC curve (AUC) value. For cross-project mobile application defect prediction, there is still room for improvement when deep learning algorithms are preferred. Keywords: software defect prediction; software fault prediction; mobile application; Android applications; deep learning; machine learning.en_US
dc.language.isoengen_US
dc.relation.urihttps://doi.org/10.3390/s22134734
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleDeep learning-based defect prediction for mobile applicationsen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.volume22en_US
dc.source.journalSensorsen_US
dc.source.issue13en_US
dc.identifier.doi10.3390/s22134734
dc.identifier.cristin2033513
dc.source.articlenumber4734
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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